多功能可编程信号发生参数测试系统

Multifunctional programmable signal generation parameter testing system

Abstract

一种多功能可编程信号发生参数测试系统,在同一个片上系统基片上或同一块系统级封装的电路基片上设置有中央处理器、存储器、时钟发生器及可编程控制信号发生源系统、数据采集系统、数字信号处理器和功能电路实时选控模块。可编程控制信号发生源系统,按照存储器内的控制指令生成设定的波形电压激励信号,功能电路实时选控模块按照中央处理器的选控指令控制其内的信号发生器模块输出激励外接被测物体的测试信号;数据采集系统,实时采集功能电路实时选控模块内的模块式组合多功能参数测试模块采集外接被测物体的应激反应模拟电信号并转换为应激反应数字信号;数字信号处理器实时快速处理数据采集系统产生的应激反应数字信号;功能电路实时选控模块实时选控组合多功能参数测试模块。本实用新型增强了测试系统在高频高速测试条件的可靠性,提高抗电磁干扰效果,实现多功能高度协同测试测量,降低成本及占地空间。
A multifunctional programmable signal generation parameter testing system is provided; a system on chip substrate or a same system level packaged circuit substrate is provided with a central processor, a memory, a clock generator, and a programmable control signal generation source system, a data acquisition system, a digital signal processor, and a function circuit real time selection control module; the programmable control signal generation source system is used for generating a set waveform voltage excitation signal according to a control indication in the memory; the function circuit real time selection control module controls a signal generation module according to the selection control indication of the central processor so as to output a testing signal exciting an external tested object; the data acquisition system uses a modularized combined multi-functional parameter test module in the function circuit real time selection control module so as to collect a stress reaction simulation electric signal of the external tested object, and the stress reaction simulation electric signal is converted into a stress reaction digital signal; the digital signal processor can fast process the stress reaction digital signal generated in the data acquisition system in real time; the function circuit real time selection control module can select and control the multi-functional parameter test module in real time; the multifunctional programmable signal generation parameter testing system can improve the reliability of the testing system under a high frequency high speed test condition, improves anti-electromagnetic interference effect, realizes multifunctional height cooperation test measurement, and reduces cost and land occupation space.

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Cited By (4)

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    CN-103941119-AJuly 23, 2014北京汇德信科技有限公司Multifunctional programmable signal generating parameter testing system
    CN-103941119-BSeptember 07, 2016北京汇德信科技有限公司一种多功能可编程信号发生参数测试系统
    CN-105388367-AMarch 09, 2016北京宇航系统工程研究所, 中国运载火箭技术研究院一种狭小舱段内部电磁环境的表征和获取方法
    CN-105606984-AMay 25, 2016中国电子科技集团公司第四十一研究所Multi-parameter parallel test system and method of semiconductor wafer test